Spotting molecule-sized features – common in computer circuits and nanoscale devices – may become both easier and more accurate with a sensor developed at the National Institute of Standards and Technology (NIST). With their new design, NIST scientists may have found a way to sidestep some of the problems in calibrating atomic force microscopes (AFMs). The AFM is one of the main scientific workhorses of the nano age. It can resolve features as small as individual atoms. Instead of magnifying ...